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High resolution microscopy is heavily dependent on superb optical elements and superresolution microscopy even more so. Correcting unavoidable optical aberrations during post-processing is an elegant method to reduce the optical system's complexity. A prime method that promises superresolution, aberration correction, and quantitative phase imaging is Fourier ptychography. This microscopy technique combines many images of the sample, recorded at differing illumination angles akin to computed tomography and uses error minimisation betwe