https://www.selleckchem.com/products/mrtx849.html
Over the last two decades, organic photovoltaic (OPV) devices have seen their efficiency increase, while long-term stability and upscaling have been demonstrated for first-generation modules. Since the maturity level of this technology has now improved, techniques for rapid quality control have become relevant. Imaging techniques such as photo- and electroluminescence have already been used for this purpose. However, defects could only be localized either in the active layer or in interface layers, without being able to distinguish betw
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