https://www.selleckchem.com/pr....oducts/CP-690550.htm
In electrical engineering, hardware experts often need to analyze electromagnetic radiation data to detect any external interference or anomaly. The field that studies this sort of assessment is called electromagnetic compatibility (EMC). As a way to support EMC analysis, we propose the use of Augmented Situated Visualization (ASV) to supply professionals with visual and interactive information that helps them to comprehend that data, however situating it where it is most relevant in its spatial context. Users are able to interact wit
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