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As a van der Waals magnetic semiconductor, chromium triiodide (CrI3) is widely considered for its high research value and potential applications. Defects in CrI3 are inevitably present and significantly alter the material properties. However, experimental identification of defects of CrI3 at the atomic level is still lacking. Here for the first time, we carried out a scanning tunneling microscopy (STM) study and density functional theory calculations to explore the intrinsic defects in monolayer CrI3 grown by molecular beam epitaxy. The
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