https://www.selleckchem.com/mTOR.html
Lamella micromachining by focused ion beam milling at cryogenic temperature (cryo-FI has matured into a preparation method widely used for cellular cryo-electron tomography. Due to the limited ablation rates of low Ga+ ion beam currents required to maintain the structural integrity of vitreous specimens, common preparation protocols are time-consuming and labor intensive. The improved stability of new-generation cryo-FIB instruments now enables automated operations. Here, we present an open-source software tool, SerialFIB, for creating automated
Like
Comment
Share
