https://www.selleckchem.com/products/CX-3543.html
The atomic force microscope (AFM) has become a powerful tool in many fields. However, environmental noise and other disturbances are very likely to cause the AFM probe to vibrate, which lead to vertical drift in AFM imaging and limit its further application. Therefore, to correct image distortion caused by vertical drift, a morphology prediction based image correction algorithm is proposed in this paper. Specifically, a Gaussian-Hann filter is first designed for distorted AFM images, based on which, an adaptive image binarization algori
Like
Comment
Share
