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To accurately determine the optical axis cut error of a nonlinear uniaxial crystal, a measurement method based on dual-optical path second-harmonic energy (SHE) rocking curve acquisition is presented in, of which the measurement uncertainty can be controlled within 3.20 µrad , 26 times higher than that of a high-precision commercial x-ray diffractometer (XRD). To meet the measurement requirements, a Type I potassium dihydrogen phosphate reference crystal (RC) is first made, and its optical axis cut error is considered as a reference. Then,
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