https://www.selleckchem.com/pr....oducts/ex229-compoun
The attainable lateral resolution of electrostatic force microscopy (EFM) in ambient air environment on dielectric materials was characterized on a reference sample comprised of two distinct, immiscible glassy polymers cut in the cross-section by ultramicrotomy. Such sample can be modeled as two semi-infinite dielectrics with a sharp interface, presenting a quasi-ideal, sharp dielectric contrast. Electric polarizability line profiles across the interface were obtained, in both lift-mode and feedback-regulated dynamic mode EFM
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