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This publisher's note contains corrections to Opt. Lett.45, 4686 (202OPLEDP0146-959210.1364/OL.399623.The strong need in materials and biological science has prompted the development of high-speed quantitative phase imaging. However, for phase retrieval applying digital micromirror devices (DMDs), the accuracy of the retrieved phase will be disturbed by the DMD-induced aberrations. Here, we propose a phase retrieval method based on measuring and correcting errors caused by phase non-uniformity of the device. Using only four binary amp
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