https://www.selleckchem.com/products/AM-1241.html
The sheet carrier density, nS, is ∼2 × 1013 cm-2 at Vg = 2 V, which is 3.5 times smaller than the predicted value and has the same order of magnitude as the ns measured for a PEO-based, dual-ion conductor on the same graphene. The numerical modeling results can be approximated by a simple analysis of capacitors in series, where the EDLs are modeled as capacitors with thickness estimated by the sum of the Debye screening length and the Stern layer. The series of capacitor estimate agrees with the numerical modeling of the dual-ion conduc
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