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The high recombination rate of photoinduced electron-hole pairs limits the hydrogen production efficiency of the MoS2 catalyst in photoelectrochemical (PEC) water splitting. The strategy of prolonging the lifetime of photoinduced carriers is of great significance to the promotion of photoelectrocatalytic hydrogen production. An ideal approach is to utilize edge defects, which can capture photoinduced electrons and thus slow down the recombination rate. However, for two-dimensional MoS2, most of the surface areas are inert basal planes.
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