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Finally, the theoretical results are verified by experiments.For insulators, the deposited charge on the surface after electron bombardment interferes with the total electron emission yield (TEEY) measurement. The key to measuring the TEEY of insulators is to eliminate the surface deposited charge. Being from traditional measurement methods, we develop and demonstrate a new method for measuring the TEEY of insulators in a scanning electron microscope by preparing the micro-patterned metal on the surface of the insulators as a conducting c
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