https://www.selleckchem.com/products/pp2.html
In this study, we propose an effective atomic number (Zeff) determination method based on a photon-counting technique. The proposed method can correct for the beam hardening effect and detector response based on polychromatic X-rays to allow high accuracy material identification. To demonstrate the effectiveness of our method, the procedure was applied to X-ray images acquired by a prototype energy-resolving photon-counting detector and we obtained an Zeff image with accuracy of Zeff ± 0.5 regardless of the mass thickness.This study compare
Like
Comment
Share
