https://www.selleckchem.com/pr....oducts/brensocatib.h
Time-of-flight secondary ion mass spectrometry fragment analysis remains a challenging task. The fragment appearance regularity (FAR) rule is particularly useful for two-element compounds such as ZnO. Ion fragments appearing in the form of ZnxOy obey the rule [Formula see text] in the positive secondary ion spectrum and [Formula see text] in the negative spectrum where the valence of Zn is + 2 and that of O is - 2. Fragment analysis in gallium-doped ZnO (GZO) films can give insights into the bonding of the elements in this important
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