https://www.selleckchem.com/pr....oducts/mizagliflozin
The result of the devices exposed in the ICP system reveals a greater electrical characteristics shift compared to the devices in NBE such as the interface trap density (Dit) in case of NBE is 3.55621×1012 cm-2eV-1 and in case of ICP is higher i.e., 4.19961×1012 cm-2eV-1.Calcium copper titanate (CaCu₃Ti₄O12; CCTO) ceramics are useful as capacitor dielectrics for many applications. In this study the effect of doping with alumina and testing atmospheres in air and dry N₂ on the stability and reproducibility of electrical and dielect
Like
Comment
Share
