https://www.selleckchem.com/products/hppe.html
At present, hopping probe ion conductance microscopy (HPICM) is the most capable ion conductance microscopy for imaging complex surface topography. However, the HPICM controller usually does not begin to stop the pipette sample approach until the ion current reaches a threshold, which results in short deceleration distances. Furthermore, closed-loop piezo actuation usually increases the response time. These problems tend to increase the ion current overshoot and affect imaging speed and quality. A fuzzy control system was developed to solv
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