https://www.selleckchem.com/products/cb-839.html
Optical coherence tomography (OCT), as an optical interferometric imaging technique, has found wide applications in various fields. In principle, OCT is well suited for imaging layered structures, and thus, one of the typical applications is thickness measurement. However, due to the limited imaging depth resulting from light attenuation, thickness measurement by OCT is limited to non-opaque materials. In this study, we developed a novel (to the best of our knowledge) dual-side view OCT (DSV-OCT) system for thickness measurement on opaqu
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