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idating other remotely-sensed physico-chemical parameters in this region.Here is presented raw and analysed data collected during study of the evolution, with uniaxial stretching, of the electrical and microcrystalline characteristics of polystyrene sulfonate doped poly(3,4-ethylenedioxythiophene) (PEDOTPSS) organic electrochemical transistors (OECTs). X-ray diffraction data from GIWAXS measurements of the PEDOTPSS material, performed at the SOLEIL light source are presented in raw and partially analysed forms. Current-voltage data, coll
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