https://www.selleckchem.com/pr....oducts/ITF2357(Givin
The reflected back focal plane from a microscope objective is known to provide excellent information of material properties and can be used to analyze the generation of surface plasmons and surface waves in a localized region. Most analysis has concentrated on direct measurement of the reflected intensity in the back focal plane. By accessing the phase information, we show that examination in the back focal plane becomes considerably more powerful allowing the reconstructed field to be filtered, propagated and analyzed in di
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