https://www.selleckchem.com/pr....oducts/baxdrostat.ht
We present a parameter retrieval method which incorporates prior knowledge about the object into ptychography. The proposed method is applied to two applications (1) parameter retrieval of small particles from Fourier ptychographic dark field measurements; (2) parameter retrieval of a rectangular structure with real-space ptychography. The influence of Poisson noise is discussed in the second part of the paper. The Cramér Rao Lower Bound in both applications is computed and Monte Carlo analysis is used to verify the calculated lower
Like
Comment
Share
