https://www.selleckchem.com/products/ml349.html
A newly developed instrument comprising a near ambient pressure (NAP) photoemission electron microscope (PEEM) and a tunable deep ultraviolet (DUV) laser source is described. This NAP-PEEM instrument enables dynamic imaging of solid surfaces in gases at pressures up to 1 mbar. A diode laser (976 nm) can illuminate a sample from the backside for in situ heating in gases up to 1200 K in minutes. The DUV laser with a tunable wavelength between 175 nm and 210 nm is perpendicularly incident onto the sample surface for PEEM imaging of a wide sp
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