https://www.selleckchem.com/products/gw3965.html
PbSe thin films were deposited on SiO2/Si wafers using chemical bath deposition for mid-wave infrared (MWIR) detection. To enhance the photosensitivity of PbSe thin films, oxidation, followed by iodization, was performed to create a PbI2/PbSe two-layer system for efficient MWIR detection in the spectral range from 3 µm to 5 µm. A near-infrared (IR) laser annealing was performed after sensitization with 1070 nm wavelength at an energy density of 1J/cm2 to selectively heat the PbSe thin films. After IR laser annealing, the change in resist
Like
Comment
Share
